Masaki Kohno

According to our database, Masaki Kohno authored at least 2 papers between 1999 and 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2001

An evaluation of defect-oriented test: WELL-controlled low voltage test.

Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm.

Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999