Masaki Kazumi

According to our database, Masaki Kazumi authored at least 2 papers in 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

A study on HCI induced gate leakage current model used for reliability simulations in 90nm n-MOSFETs.

Nobukazu Tsukiji, Hitoshi Aoki, Masaki Kazumi, Takuya Totsuka, Masashi Higashino, Haruo Kobayashi

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

Study on maximum electric field modeling used for HCI induced degradation characteristic of LDMOS transistors.

Masashi Higashino, Hitoshi Aoki, Nobukazu Tsukiji, Masaki Kazumi, Takuya Totsuka, Haruo Kobayashi

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015