Masahiro Ishida

According to our database, Masahiro Ishida authored at least 54 papers between 1991 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Application of Residue Sampling to RF/AMS Device Testing.

Shogo Katayama, Yudai Abe, Anna Kuwana, Koji Asami, Masahiro Ishida, Ryuya Ohta, Haruo Kobayashi

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2019

A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces.

Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida

Proceedings of the IEEE International Test Conference, 2019

2018

Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment.

Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

J. Electron. Test., 2018

A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces.

Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida

Proceedings of the IEEE International Test Conference, 2018

2017

Innovative practices session 10B innovative practices in Asia-2: From cost perspective.

Kazumi Hatayama, Masahiro Ishida

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Innovative practices session 9B innovative practices in Asia-1: From quality perspective.

Kazumi Hatayama, Masahiro Ishida

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

A jitter separation and BER estimation method for asymmetric total jitter distributions.

Masahiro Ishida, Kiyotaka Ichiyama

Proceedings of the IEEE International Test Conference, 2017

Extension of power supply impedance emulation method on ATE for multiple power domain.

Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing.

Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada

IEICE Trans. Electron., 2016

Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing.

Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada

J. Electron. Test., 2016

An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces.

Masahiro Ishida, Kiyotaka Ichiyama

IEEE Des. Test, 2016

A fully integrated GaN-based power IC including gate drivers for high-efficiency DC-DC Converters.

Shinji Ujita, Yusuke Kinoshita, Hidekazu Umeda, Tatsuo Morita, Kazuhiro Kaibara, Satoshi Tamura, Masahiro Ishida, Tetsuzo Ueda

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board.

Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the 2016 IEEE International Test Conference, 2016

An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware.

Kazuki Shirahata, Takeshi Mizushima, Tasuku Fujibe, Hidenobu Matsumura, Tomoyuki Itakura, Masahiro Ishida, Daisuke Watanabe, Shin Masuda

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Conducted noise of GaN Schottky barrier diode in a DC-DC converter.

Takaaki Ibuchi, Tsuyoshi Funaki, Shinji Ujita, Masahiro Ishida, Tetsuzo Ueda

IEICE Electron. Express, 2015

A new method for measuring alias-free aperture jitter in an ADC output.

Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma

Proceedings of the 2015 IEEE International Test Conference, 2015

An ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces.

Masahiro Ishida, Kiyotaka Ichiyama

Proceedings of the 2015 IEEE International Test Conference, 2015

A Technique for Analyzing On-Chip Power Supply Impedance.

Masahiro Ishida, Toru Nakura, Akira Matsukawa, Rimon Ikeno, Kunihiro Asada

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test.

Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills.

Masahiro Ishida, Takashi Kusaka, Toru Nakura, Satoshi Komatsu, Kunihiro Asada

Proceedings of the 2014 International Test Conference, 2014

30.5 A GaN 3×3 matrix converter chipset with Drive-by-Microwave technologies.

Shuichi Nagai, Yasuhiro Yamada, Noboru Negoro, Hiroyuki Handa, Yuji Kudoh, Hiroaki Ueno, Masahiro Ishida, Nobuyuki Otuska, Daisuke Ueda

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution.

Jose Moreira, Hubert Werkmann, Masahiro Ishida, Bernhard Roth, Volker Filsinger, Sui-Xia Yang

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

A functional test of 2-GHz/4-GHz RF digital communication device using digital tester.

Kiyotaka Ichiyama, Masahiro Ishida, Kenichi Nagatani, Toshifumi Watanabe

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost.

Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata

IEEE Des. Test Comput., 2012

Marker based camera pose estimation for underwater robots.

Masahiro Ishida, Kazuhiro Shimonomura

Proceedings of the IEEE/SICE International Symposium on System Integration, 2012

Power integrity control of ATE for emulating power supply fluctuations on customer environment.

Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada

Proceedings of the 2012 IEEE International Test Conference, 2012

Post-Silicon Jitter Measurements.

Kiichi Niitsu, Takahiro J. Yamaguchi, Masahiro Ishida, Haruo Kobayashi

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Real-time testing method for 16 Gbps 4-PAM signal interface.

Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu

Proceedings of the 2011 IEEE International Test Conference, 2011

2009

A robust method for identifying a deterministic jitter model in a total jitter distribution.

Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, Masahiro Ishida

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.

Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa

Proceedings of the 2008 IEEE International Test Conference, 2008

Total Jitter Measurement for Testing HSIO Integrated SoCs.

Takahiro J. Yamaguchi, Masahiro Ishida

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.

Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma

Proceedings of the 2007 IEEE International Test Conference, 2007

Data jitter measurement using a delta-time-to-voltage converter method.

Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma

Proceedings of the 2007 IEEE International Test Conference, 2007

An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter.

Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter.

Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

A Study of Per-Pin Timing Jitter Scope.

Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma

Proceedings of the 2006 IEEE International Test Conference, 2006

A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement.

Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

A wideband low-noise ATE-based method for measuring jitter in GHz signals.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Skew measurements in clock distribution circuits using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems.

Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe, Tadahiro Ohmi

IEEE Trans. Circuits Syst. II Express Briefs, 2003

Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha

J. Electron. Test., 2003

Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements.

Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

A Method for Compressing Test Data Based on Burrows-Wheeler Transformation.

Takahiro J. Yamaguchi, Dong Sam Ha, Masahiro Ishida, Tadahiro Ohmi

IEEE Trans. Computers, 2002

Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter.

Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices.

Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Hirobumi Musha

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, David Halter, Rajesh Raina, Jim Nissen

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Testing clock distribution circuits using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Jitter measurements of a PowerPC^TM microprocessor using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

COMPACT: A Hybrid Method for Compressing Test Data.

Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1997

An Efficient Method for Compressing Test Data.

Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1991

Programming for Parallel Pattern Generators.

M. Kanzaki, Masahiro Ishida

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991