Masahiro Ichimiya

According to our database, Masahiro Ichimiya authored at least 9 papers between 1998 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Electric field for detecting open leads in CMOS logic circuits by supply current testing.

Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004

A test circuit for pin shorts generating oscillation in CMOS logic circuits.

Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada

Syst. Comput. Jpn., 2004

2002

Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.

Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001

Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.

Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

CMOS open defect detection by supply current test.

Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

IDDQ Sensing Technique for High Speed IDDQ Testing.

Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application.

Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

High speed IDDQ test and its testability for process variation.

Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1998

A High-Speed IDDQ Sensor for Low-Voltage ICs.

Masaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998