Masahiro Horibe
Orcid: 0000-0002-1193-607X
According to our database1,
Masahiro Horibe
authored at least 24 papers
between 2007 and 2021.
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Bibliography
2021
Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz.
IEEE Trans. Instrum. Meas., 2021
2020
IEEE Trans. Instrum. Meas., 2020
Electromagnetic Measurement Techniques for Materials and Device Used in 6G Wireless Communications.
Proceedings of the 2nd 6G Wireless Summit, 2020
2019
Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process.
IEEE Trans. Instrum. Meas., 2019
Broadband Permittivity Measurements up to 170-GHz Using Balanced-Type Circular-Disk Resonator Excited by 0.8-mm Coaxial Line.
IEEE Trans. Instrum. Meas., 2019
Improvement of Broadband Characterization of Dielectric Waveguide at the $Ka$ -Band by Using TRL Calibration Method.
IEEE Trans. Instrum. Meas., 2019
Measurement Capability of Scanning Microwave Microscopy: Measurement Sensitivity Versus Accuracy.
IEEE Trans. Instrum. Meas., 2019
IEICE Electron. Express, 2019
2018
Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency.
IEEE Trans. Instrum. Meas., 2018
Nondestructive method using transmission line for detection of foreign objects in food.
Proceedings of the 2018 IEEE Sensors Applications Symposium, 2018
2017
IEEE Trans. Instrum. Meas., 2017
Improvement of Transmission/Reflection Method for Permittivity Measurement Using Long Fixtures With Time-Domain Analysis Approach.
IEEE Trans. Instrum. Meas., 2017
New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials.
IEEE Trans. Instrum. Meas., 2017
Development of S-Parameter Calibration System for Type-N, 75-Ω Connector Below 12 GHz.
IEEE Trans. Instrum. Meas., 2017
Measurement Uncertainty Model for Vector Network Analyzers With Frequency Extension Modules at Terahertz Frequencies.
IEEE Trans. Instrum. Meas., 2017
2016
Low Cost, High Performance of Coplanar Waveguide Fabricated by Screen Printing Technology.
IEICE Trans. Electron., 2016
2015
New Uncertainty Analysis for Permittivity Measurements Using the Transmission/Reflection Method.
IEEE Trans. Instrum. Meas., 2015
2014
Comparison of Calculation Techniques for Q-Factor Determination of Resonant Structures Based on Influence of VNA Measurement Uncertainty.
IEICE Trans. Electron., 2014
2013
Establishment of S-parameter Traceability for 3.5 mm Coaxial Lines from 10 MHz to 100 MHz.
IEEE Trans. Instrum. Meas., 2013
IEEE Trans. Instrum. Meas., 2013
2011
Comparison Between NPL and NMIJ of Diameter and Scattering Parameter Measurements of Precision 1.85 mm Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2011
2009
IEEE Trans. Instrum. Meas., 2009
Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2009
2007
S-Parameters of Standard Airlines Whose Connector Is Tightened With Specified Torque.
IEEE Trans. Instrum. Meas., 2007