Maryam Rajabalipanah

According to our database, Maryam Rajabalipanah authored at least 7 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Sharing AES Engine for RISC-V Custom Instructions Performing Encryption and Decryption.

Zahra Hojati, Zahra Jahanpeima, Maryam Rajabalipanah, Hossein Ta'ati, Atefe Rabiei, Zainalabedin Navabi

Proceedings of the IEEE East-West Design & Test Symposium, 2024

Configurable DRAM Access for Neural Network Accelerators: A SystemC Virtual Platform Approach.

Tina Hashemi, Rezgar Sadeghi, Maryam Rajabalipanah, Zahra Hojati, Zainalabedin Navabi

Proceedings of the IEEE East-West Design & Test Symposium, 2024

2023

HIRMA: High-Performance Implementation for RISC-V Microcontroller Applications.

Negin Safari, Amirmahdi Joudi, Maryam Rajabalipanah, Zahra Jahanpeima, Hasan Sadeghzadeh, Zainalabedin Navabi

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2021

AFTAB: A RISC-V Implementation with Configurable Gateways for Security.

Maryam Rajabalipanah, Mahboobe Sadeghipour Roodsari, Zahra Jahanpeima, Gianluca Roascio, Paolo Prinetto, Zainalabedin Navabi

Proceedings of the IEEE East-West Design & Test Symposium, 2021

2020

Reducing DFT hardware overhead by use of a test microprogram in a microprogrammed hardware accelerator.

Maryam Rajabalipanah, Seyedeh Maryam Ghasemi, Nooshin Nosrati, Katayoon Basharkhah, Saba Yousefzadeh, Zainalabedin Navabi

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

Reconfiguration of Embedded Accelerators by Microprogramming for Intensive Loop Computations.

Saba Yousefzadeh, Katayoon Basharkhah, Nooshin Nosrati, Maryam Rajabalipanah, Seyedeh Maryam Ghasemi, Zainalabedin Navabi

Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019

SCOAP-based Directed Random Test Generation for Combinational Circuits.

Seyyede Maryam Ghasemy, Maryam Rajabalipanah, Saeideh Sarmadi, Zainalabedin Navabi

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019