Mary P. Kusko

According to our database, Mary P. Kusko authored at least 10 papers between 1997 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Testing the IBM Power 7™ 4 GHz eight core microprocessor.

James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Structural and functional test of IBM System z10 chips.

Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur

IBM J. Res. Dev., 2009

Low cost test point insertion without using extra registers for high performance design.

Haoxing Ren, Mary P. Kusko, Victor N. Kravets, Rona Yaari

Proceedings of the 2009 IEEE International Test Conference, 2009

2001

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.

Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

S/390 G5 CMOS microprocessor diagnostics.

Peilin Song, Franco Motika, Daniel R. Knebel, Richard F. Rizzolo, Mary P. Kusko

IBM J. Res. Dev., 1999

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.

Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Testing the 500-MHz IBM S/390 Microprocessor.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins

IEEE Des. Test Comput., 1998

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.

Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Advanced microprocessor test strategy and methodology.

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen

IBM J. Res. Dev., 1997

Testing the 400-MHz IBM Generation-4 CMOS Chip.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997