Martin M. Frank

According to our database, Martin M. Frank authored at least 11 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A Heterogeneous and Programmable Compute-In-Memory Accelerator Architecture for Analog-AI Using Dense 2-D Mesh.

Shubham Jain, Hsinyu Tsai, Ching-Tzu Chen, Ramachandran Muralidhar, Irem Boybat, Martin M. Frank, Stanislaw Wozniak, Milos Stanisavljevic, Praneet Adusumilli, Pritish Narayanan, Kohji Hosokawa, Masatoshi Ishii, Arvind Kumar, Vijay Narayanan, Geoffrey W. Burr

IEEE Trans. Very Large Scale Integr. Syst., 2023

Architectures and Circuits for Analog-memory-based Hardware Accelerators for Deep Neural Networks (Invited).

Hsinyu Tsai, Pritish Narayanan, Shubham Jain, Stefano Ambrogio, Kohji Hosokawa, Masatoshi Ishii, Charles Mackin, Ching-Tzu Chen, Atsuya Okazaki, Akiyo Nomura, Irem Boybat, Ramachandran Muralidhar, Martin M. Frank, Takeo Yasuda, Alexander M. Friz, Yasuteru Kohda, An Chen, Andrea Fasoli, Malte J. Rasch, Stanislaw Wozniak, Jose Luquin, Vijay Narayanan, Geoffrey W. Burr

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited).

Martin M. Frank, Ning Li, Malte J. Rasch, Shubham Jain, Ching-Tzu Chen, Ramachandran Muralidhar, Jin-Ping Han, Vijay Narayanan, Timothy Philip, Kevin Brew, Andrew Simon, Iqbal Saraf, Nicole Saulnier, Irem Boybat, Stanislaw Wozniak, Abu Sebastian, Pritish Narayanan, Charles Mackin, An Chen, Hsinyu Tsai, Geoffrey W. Burr

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation.

Franco Stellari, Ernest Y. Wu, Martin M. Frank, Leonidas E. Ocala, Takashi Ando, Peilin Song

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2020

Emerging Neural Workloads and Their Impact on Hardware.

David Brooks, Martin M. Frank, Tayfun Gokmen, Udit Gupta, Xiaobo Sharon Hu, Shubham Jain, Ann Franchesca Laguna, Michael T. Niemier, Ian O'Connor, Anand Raghunathan, Ashish Ranjan, Dayane Reis, Jacob R. Stevens, Carole-Jean Wu, Xunzhao Yin

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Reliability Challenges with Materials for Analog Computing.

Eduard A. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Youngseok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, Paul M. Solomon, Wilfried Haensch, Matthew J. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation.

Eduard Cartier, Martin M. Frank, Takashi Ando, John Rozen, Vijay Narayanan

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Electron mobility in thin In0.53Ga0.47As channel.

Eduard Cartier, Atreya Majumdar, K.-T. Lee, Takashi Ando, Martin M. Frank, John Rozen, Keith A. Jenkins, C. Liang, C.-W. Cheng, John Bruley, M. Hopstaken, Pranita Kerber, J.-B. Yau, X. Sun, Renee T. Mo, Chun-Chen Yeh, Effendi Leobandung, Vijay Narayanan

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2011

High-k/metal gate innovations enabling continued CMOS scaling.

Martin M. Frank

Proceedings of the 37th European Solid-State Circuits Conference, 2011

2006

Germanium channel MOSFETs: Opportunities and challenges.

Huiling Shang, Martin M. Frank, Evgeni P. Gusev, Jack O. Chu, Stephen W. Bedell, Kathryn W. Guarini, Mei-Kei Ieong

IBM J. Res. Dev., 2006

Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges.

Evgeni P. Gusev, Vijay Narayanan, Martin M. Frank

IBM J. Res. Dev., 2006