Martin Kuball
Orcid: 0000-0003-3070-1070
According to our database1,
Martin Kuball
authored at least 12 papers
between 2011 and 2023.
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Bibliography
2023
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Current collapse and kink effect in GaN RF HEMTs: the key role of the epitaxial buffer.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020
2019
Thermal analysis of semiconductor devices and materials - Why should I not trust a thermal simulation ?
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019
2018
Microelectron. Reliab., 2018
2017
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs.
Microelectron. Reliab., 2017
2015
Microelectron. Reliab., 2015
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence.
Microelectron. Reliab., 2015
2014
Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation.
Microelectron. Reliab., 2014
Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab., 2014
2012
Microelectron. Reliab., 2012
Improved thermal management for GaN power electronics: Silver diamond composite packages.
Microelectron. Reliab., 2012
2011
AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes.
Microelectron. Reliab., 2011