Martin Huch

According to our database, Martin Huch authored at least 16 papers between 1991 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Embedded Feature Selection in MCU Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the IEEE International Conference on Design, 2024

2023

A Multilabel Active Learning Framework for Microcontroller Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

Performance Screening Using Functional Path Ring Oscillators.

Tobias Kilian, Daniel Tille, Martin Huch, Markus Hanel, Ulf Schlichtmann

IEEE Trans. Very Large Scale Integr. Syst., June, 2023

Feature Selection for Cost Reduction In MCU Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Semi-Supervised Deep Learning for Microcontroller Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the IEEE European Test Symposium, 2023

An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators.

Tobias Kilian, Abhishek Sengupta, Daniel Tille, Martin Huch, Ulf Schlichtmann

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Enabling Inter-Product Transfer Learning on MCU Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data.

Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann

Proceedings of the IEEE International Test Conference, 2022

Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators.

Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann

Proceedings of the IEEE European Test Symposium, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022

2021

A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators.

Tobias Kilian, Heiko Ahrens, Daniel Tille, Martin Huch, Ulf Schlichtmann

Proceedings of the IEEE International Test Conference, 2021

Exploiting Active Learning for Microcontroller Performance Prediction.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors.

Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the IEEE International Test Conference, 2020

2011

Variations of fault manifestation during Burn-In - A case study on industrial SRAM test results.

Michael Linder, Alfred Eder, Klaus Oberländer, Martin Huch

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

1991

Höchstintegration von defekttoleranten Array-Prozessoren für die Echtzeitbildverarbeitung.

Martin Huch

PhD thesis, 1991