Markku Moilanen

According to our database, Markku Moilanen authored at least 8 papers between 2004 and 2012.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2012

Current State of the Mixed-Signal Test Bus 1149.4.

Jari Hannu, Juha Häkkinen, Juha-Veikko Voutilainen, Heli Jantunen, Markku Moilanen

J. Electron. Test., 2012

2011

Solder interconnection failure time estimation based on the embedded precursor behaviour modelling.

Juha-Veikko Voutilainen, Juha Häkkinen, Markku Moilanen

Microelectron. Reliab., 2011

2010

Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture.

Jari Hannu, Teuvo Saikkonen, Juha Häkkinen, Juha Karttunen, Markku Moilanen

J. Electron. Test., 2010

2009

A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture.

Juha-Veikko Voutilainen, Jussi Putaala, Markku Moilanen, Heli Jantunen

Microelectron. J., 2009

2007

Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment.

Teuvo Saikkonen, Markku Moilanen

J. Electron. Test., 2007

Methods of Testing Discrete Semiconductors in the 1149.4 Environment.

Jari Hannu, Markku Moilanen

J. Electron. Test., 2007

2005

IEEE 1149.4 Compatible ABMs for Basic RF Measurements.

Pekka Syri, Juha Häkkinen, Markku Moilanen

Proceedings of the 2005 Design, 2005

2004

A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4.

Juha Häkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004