Markku Leskelä

Orcid: 0000-0001-5830-2800

According to our database1, Markku Leskelä authored at least 4 papers between 2005 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2014
Single-parameter model for the post-breakdown conduction characteristics of HoTiO<sub>x</sub>-based MIM capacitors.
Microelectron. Reliab., 2014

2007
Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics.
Microelectron. Reliab., 2007

2006
Characterisation of the Al<sub>2</sub>O<sub>3</sub> films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H-SiC devices.
Microelectron. Reliab., 2006

2005
Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition.
Microelectron. Reliab., 2005


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