Mark Zwolinski
Orcid: 0000-0002-2230-625XAffiliations:
- University of Southampton, School of Electronics and Computer Science, UK
According to our database1,
Mark Zwolinski
authored at least 130 papers
between 1990 and 2024.
Collaborative distances:
Collaborative distances:
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Online presence:
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on zbmath.org
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on orcid.org
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on dl.acm.org
On csauthors.net:
Bibliography
2024
CoRR, 2024
CoRR, 2024
Proceedings of the 22nd IEEE Interregional NEWCAS Conference, 2024
2022
Using Formal Methods to Evaluate Hardware Reliability in the Presence of Soft Errors.
Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022
Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022
Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022
2021
Microprocess. Microsystems, 2021
A Survey on the Susceptibility of PUFs to Invasive, Semi-Invasive and Noninvasive Attacks: Challenges and Opportunities for Future Directions.
J. Circuits Syst. Comput., 2021
2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
VLSI Implementation of a Fully-Pipelined K-Best MIMO Detector with Successive Interference Cancellation.
Circuits Syst. Signal Process., 2019
Proceedings of the 4th IEEE International Verification and Security Workshop, 2019
Proceedings of the 4th IEEE International Verification and Security Workshop, 2019
2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
IEEE Trans. Circuits Syst. II Express Briefs, 2018
Hardware Implementation of a Low-Power K-Best MIMO Detector Based on a Hybrid Merge Network.
Proceedings of the 28th International Symposium on Power and Timing Modeling, 2018
Proceedings of the 3rd IEEE International Verification and Security Workshop, 2018
A Power Efficient Crossbar Arbitration in Multi-NoC for Multicast and Broadcast Traffic.
Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2018
Early detection of system-level anomalous behaviour using hardware performance counters.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
Proceedings of the 27th IEEE Asian Test Symposium, 2018
2017
Proceedings of the 14th International Conference on Synthesis, 2017
Proceedings of the IEEE 2nd International Verification and Security Workshop, 2017
Proceedings of the IEEE 2nd International Verification and Security Workshop, 2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Proceedings of the Languages, Design Methods, and Tools for Electronic System Design, 2017
2016
IEEE Trans. Very Large Scale Integr. Syst., 2016
<i>σ</i> <sup> <i>n</i> </sup>LBDR: generic congestion handling routing implementation for two-dimensional mesh network-on-chip.
IET Comput. Digit. Tech., 2016
Circuits Syst. Signal Process., 2016
IEEE Access Special Section Editorial: Security and Reliability Aware System Design for Mobile Computing Devices.
IEEE Access, 2016
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
Proceedings of the IEEE 59th International Midwest Symposium on Circuits and Systems, 2016
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016
High accuracy implementation of Adaptive Exponential integrated and fire neuron model.
Proceedings of the 2016 International Joint Conference on Neural Networks, 2016
Proceedings of the 11th European Workshop on Microelectronics Education, 2016
The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator.
Proceedings of the 21th IEEE European Test Symposium, 2016
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016
2015
Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs.
IEEE Trans. Very Large Scale Integr. Syst., 2015
IEEE Trans. Computers, 2015
Proceedings of the 28th International Conference on VLSI Design, 2015
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015
Proceedings of the 15th International Symposium on Communications and Information Technologies, 2015
Proceedings of the 2015 Forum on Specification and Design Languages, 2015
2014
IEEE Trans. Very Large Scale Integr. Syst., 2014
Microelectron. Reliab., 2014
Proceedings of the 2014 27th International Conference on VLSI Design, 2014
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Proceedings of the 2014 NORCHIP, Tampere, Finland, October 27-28, 2014, 2014
Proceedings of the Eighth IEEE/ACM International Symposium on Networks-on-Chip, 2014
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014
Proceedings of the Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21, 2014
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
2013
Energy-Conscious Turbo Decoder Design: A Joint Signal Processing and Transmit Energy Reduction Approach.
IEEE Trans. Veh. Technol., 2013
Oscillation-based analog diagnosis using artificial neural networks based inference mechanism.
Comput. Electr. Eng., 2013
Proceedings of the VLSI Design and Test, 17th International Symposium, 2013
Proceedings of the International Symposium on Physical Design, 2013
2012
A Large Scale Digital Simulation of Spiking Neural Networks (SNN) on Fast SystemC Simulator.
Proceedings of the 14th International Conference on Computer Modelling and Simulation, 2012
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012
2011
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Microelectron. Reliab., 2011
Proceedings of the 4th International Conference on Security of Information and Networks, 2011
Proceedings of the 13th IEEE International Conference on High Performance Computing & Communication, 2011
Proceedings of the 16th European Test Symposium, 2011
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.
Proceedings of the Design, Automation and Test in Europe, 2011
Proceedings of the 2011 NASA/ESA Conference on Adaptive Hardware and Systems, 2011
2010
IET Comput. Digit. Tech., 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Design metrics for RTL level estimation of delay variability due to intradie (random) variations.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the IEEE/IFIP 8th International Conference on Embedded and Ubiquitous Computing, 2010
Proceedings of the 7th Conference on Computing Frontiers, 2010
2009
Microelectron. Reliab., 2009
Analytical Transient Response and Propagation Delay Model for Nanoscale CMOS Inverter.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009
Proceedings of the Design, Automation and Test in Europe, 2009
2008
Des. Autom. Embed. Syst., 2008
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008
Proceedings of the 45th Design Automation Conference, 2008
Proceedings of the Cryptographic Hardware and Embedded Systems, 2008
Behavioural Modelling for Stability of CMOS SRAM Cells Subject to Random Discrete Doping.
Proceedings of the 2008 IEEE International Behavioral Modeling and Simulation Workshop, 2008
2007
Microelectron. Reliab., 2007
Evaluation of Dynamic Voltage and Frequency Scaling as a Differential Power Analysis Countermeasure.
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007
Proceedings of the 14th IEEE International Conference on Electronics, 2007
Proceedings of the 14th IEEE International Conference on Electronics, 2007
Proceedings of the Second NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2007), 2007
2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
IEEE Trans. Computers, 2006
Proceedings of the 11th European Test Symposium, 2006
2005
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
2004
Int. J. Circuit Theory Appl., 2004
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.
J. Electron. Test., 2004
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004
Behavioural modelling of analogue faults in VHDL-AMS - a case study.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
2003
Globally convergent algorithms for DC operating point analysis of nonlinear circuits.
IEEE Trans. Evol. Comput., 2003
The continuous-discrete interface - What does this really mean? Modelling and simulation issues.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003
Versatile High-Level Synthesis of Self-Checking Datapaths Using an On-Line Testability Metric.
Proceedings of the 2003 Design, 2003
2002
Transformation Based Insertion of On-Line Testing Resources in a High-Level Synthesis Environment.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002
Proceedings of the 2002 Design, 2002
Using evolutionary and hybrid algorithms for DC operating point analysis of nonlinear circuits.
Proceedings of the 2002 Congress on Evolutionary Computation, 2002
2001
IEEE Trans. Pattern Anal. Mach. Intell., 2001
Microelectron. Reliab., 2001
Practical algorithms for fully decoupled mixed-mode simulation of electronic circuits.
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001
Process variation independent built-in current sensor for analogue built-in self-test.
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001
2000
Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
Proceedings of the Intelligent Data Engineering and Automated Learning, 2000
1999
Proceedings of the 1999 Design, 1999
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, 1999
1998
A design for test technique to increase the resolution of analogue supply current tests.
Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998
1997
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations.
Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997
1996
Proceedings of the 1996 European Design and Test Conference, 1996
1992
Interleaving: an additional topological compaction technique for Weinberger array generation.
Comput. Aided Des., 1992
1991
A General Purpose Network Solving System.
Proceedings of the VLSI 91, 1991
1990