Mark Malinoski

According to our database, Mark Malinoski authored at least 2 papers between 1998 and 2001.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2001

Rapid-response temperature control provides new defect screening opportunities.

Mark Malinoski, Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

A test site thermal control system for at-speed manufacturing testing.

Mark Malinoski, James Maveety, Steve Knostman, Tom Jones

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998