Mark M. Tehranipoor
Orcid: 0000-0003-4699-3231Affiliations:
- University of Florida, Institute for Cybersecurity Research (FICS), Gainesville, FL, USA
- University of Connecticut, Center for Hardware Assurance, Security, and Engineering (CHASE), Storrs, CT, USA
According to our database1,
Mark M. Tehranipoor
authored at least 419 papers
between 2005 and 2024.
Collaborative distances:
Collaborative distances:
Awards
ACM Fellow
ACM Fellow 2021, "For contributions to microelectronics security and trust".
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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Bibliography
2024
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2024
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2024
IEEE Des. Test, August, 2024
IEEE Des. Test, August, 2024
IEEE Trans. Very Large Scale Integr. Syst., July, 2024
FLAT: Layout-Aware and Security Property-Assisted Timing Fault-Injection Attack Assessment.
IEEE Trans. Very Large Scale Integr. Syst., June, 2024
IEEE Trans. Very Large Scale Integr. Syst., February, 2024
ACM Trans. Design Autom. Electr. Syst., January, 2024
Exploring the Abyss? Unveiling Systems-on-Chip Hardware Vulnerabilities Beneath Software.
IEEE Trans. Inf. Forensics Secur., 2024
IEEE Trans. Inf. Forensics Secur., 2024
Improving Bounded Model Checkers Scalability for Circuit De-Obfuscation: An Exploration.
IEEE Trans. Inf. Forensics Secur., 2024
IACR Cryptol. ePrint Arch., 2024
SoCureLLM: An LLM-driven Approach for Large-Scale System-on-Chip Security Verification and Policy Generation.
IACR Cryptol. ePrint Arch., 2024
IACR Cryptol. ePrint Arch., 2024
Advancing Trustworthiness in System-in-Package: A Novel Root-of-Trust Hardware Security Module for Heterogeneous Integration.
IEEE Access, 2024
Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024
Continuity in Security: Leveraging LLM for Translating Security Properties Across Hardware Designs.
Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024
SECT-HI: Enabling Secure Testing for Heterogeneous Integration to Prevent SiP Counterfeits.
Proceedings of the IEEE International Test Conference, 2024
HI-SST: Safeguarding SiP Authenticity Through Secure Split-Test in Heterogeneous Integration.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024
SAP: Silicon Authentication Platform for System-on-Chip Supply Chain Vulnerabilities.
Proceedings of the IEEE International Symposium on Performance Analysis of Systems and Software, 2024
Empowering Hardware Security with LLM: The Development of a Vulnerable Hardware Database.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024
Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024
SeeMLess: Security Evaluation of Logic Locking using Machine Learning oriented Estimation.
Proceedings of the Great Lakes Symposium on VLSI 2024, 2024
RL-TPG: Automated Pre-Silicon Security Verification through Reinforcement Learning-Based Test Pattern Generation.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
FormalFuzzer: Formal Verification Assisted Fuzz Testing for SoC Vulnerability Detection.
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024
2023
iPROBE: Internal Shielding Approach for Protecting Against Front-Side and Back-Side Probing Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023
FSMx-Ultra: Finite State Machine Extraction From Gate-Level Netlist for Security Assessment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023
Enabling Security of Heterogeneous Integration: From Supply Chain to In-Field Operations.
IEEE Des. Test, October, 2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., July, 2023
ACM J. Emerg. Technol. Comput. Syst., April, 2023
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology.
IEEE Des. Test, April, 2023
Introduction to the Special Issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle.
ACM J. Emerg. Technol. Comput. Syst., January, 2023
IACR Cryptol. ePrint Arch., 2023
ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction.
IACR Cryptol. ePrint Arch., 2023
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
Special Session: CAD for Hardware Security - Promising Directions for Automation of Security Assurance.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2023
Dual Channel EM/Power Attack Using Mutual Information and its Real-time Implementation.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2023
Proceedings of the Great Lakes Symposium on VLSI 2023, 2023
BitFREE: On Significant Speedup and Security Applications of FPGA Bitstream Format Reverse Engineering.
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the IEEE European Test Symposium, 2023
QuardTropy: Detecting and Quantifying Unauthorized Information Leakage in Hardware Designs using g-entropy.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
ActiWate: Adaptive and Design-agnostic Active Watermarking for IP Ownership in Modern SoCs.
Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023
Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023
Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023
2022
Trust-Hub Trojan Benchmark for Hardware Trojan Detection Model Creation using Machine Learning.
Dataset, September, 2022
IEEE Trans. Very Large Scale Integr. Syst., 2022
RASCv2: Enabling Remote Access to Side-Channels for Mission Critical and IoT Systems.
ACM Trans. Design Autom. Electr. Syst., 2022
eChain: A Blockchain-Enabled Ecosystem for Electronic Device Authenticity Verification.
IEEE Trans. Consumer Electron., 2022
SoFI: Security Property-Driven Vulnerability Assessments of ICs Against Fault-Injection Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
ACED-IT: Assuring Confidential Electronic Design Against Insider Threats in a Zero-Trust Environment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
ACM J. Emerg. Technol. Comput. Syst., 2022
ToSHI - Towards Secure Heterogeneous Integration: Security Risks, Threat Assessment, and Assurance.
IACR Cryptol. ePrint Arch., 2022
Digital Twin for Secure Semiconductor Lifecycle Management: Prospects and Applications.
IACR Cryptol. ePrint Arch., 2022
PQC-SEP: Power Side-channel Evaluation Platform for Post-Quantum Cryptography Algorithms.
IACR Cryptol. ePrint Arch., 2022
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection.
IACR Cryptol. ePrint Arch., 2022
IACR Cryptol. ePrint Arch., 2022
Fuzz, Penetration, and AI Testing for SoC Security Verification: Challenges and Solutions.
IACR Cryptol. ePrint Arch., 2022
IACR Cryptol. ePrint Arch., 2022
IEEE Des. Test, 2022
Real-time instruction-level verification of remote IoT/CPS devices via side channels.
Discov. Internet Things, 2022
FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the RTL for Security Applications.
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE International Test Conference, 2022
LDTFI: Layout-aware Timing Fault-Injection Attack Assessment Against Differential Fault Analysis.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
Warm Up before Circuit De-obfuscation? An Exploration through Bounded-Model-Checkers.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022
2021
Security Assessment of Dynamically Obfuscated Scan Chain Against Oracle-guided Attacks.
ACM Trans. Design Autom. Electr. Syst., 2021
A Metal-Via Resistance Based Physically Unclonable Function With Backend Incremental ADC.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
ACM J. Emerg. Technol. Comput. Syst., 2021
Hardware Trust and Assurance through Reverse Engineering: A Tutorial and Outlook from Image Analysis and Machine Learning Perspectives.
ACM J. Emerg. Technol. Comput. Syst., 2021
Rock'n'roll PUFs: crafting provably secure pufs from less secure ones (extended version).
J. Cryptogr. Eng., 2021
FPGA-based Physical Unclonable Functions: A comprehensive overview of theory and architectures.
Integr., 2021
IACR Cryptol. ePrint Arch., 2021
IACR Cryptol. ePrint Arch., 2021
SAIF: Automated Asset Identification for Security Verification at the Register Transfer Level.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021
Special Session: CAD for Hardware Security - Automation is Key to Adoption of Solutions.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021
Proceedings of the IEEE International Test Conference, 2021
Proceedings of the IEEE International Test Conference, 2021
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021
AutoMap: Automated Mapping of Security Properties Between Different Levels of Abstraction in Design Flow.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021
Proceedings of the 26th IEEE European Test Symposium, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification.
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
SCRIPT: A CAD Framework for Power Side-channel Vulnerability Assessment Using Information Flow Tracking and Pattern Generation.
ACM Trans. Design Autom. Electr. Syst., 2020
Hidden in Plaintext: An Obfuscation-based Countermeasure against FPGA Bitstream Tampering Attacks.
ACM Trans. Design Autom. Electr. Syst., 2020
ACM Trans. Design Autom. Electr. Syst., 2020
IACR Trans. Cryptogr. Hardw. Embed. Syst., 2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Special Issue: 2019 PAINE Conference - Physical Assurance and Inspection of Electronics.
J. Hardw. Syst. Secur., 2020
ACM J. Emerg. Technol. Comput. Syst., 2020
ACM J. Emerg. Technol. Comput. Syst., 2020
Permutation Network De-obfuscation: A Delay-based Attack and Countermeasure Investigation.
ACM J. Emerg. Technol. Comput. Syst., 2020
FICS-PCB: A Multi-Modal Image Dataset for Automated Printed Circuit Board Visual Inspection.
IACR Cryptol. ePrint Arch., 2020
CoRR, 2020
Hardware Trust and Assurance through Reverse Engineering: A Survey and Outlook from Image Analysis and Machine Learning Perspectives.
CoRR, 2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE International Test Conference in Asia, 2020
The Key is Left under the Mat: On the Inappropriate Security Assumption of Logic Locking Schemes.
Proceedings of the 2020 IEEE International Symposium on Hardware Oriented Security and Trust, 2020
Proceedings of the 4th ACM Workshop on Attacks and Solutions in Hardware Security Workshop, 2020
2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
Recycled FPGA Detection Using Exhaustive LUT Path Delay Characterization and Voltage Scaling.
IEEE Trans. Very Large Scale Integr. Syst., 2019
ACM Trans. Design Autom. Electr. Syst., 2019
IEEE Trans. Dependable Secur. Comput., 2019
IACR Trans. Cryptogr. Hardw. Embed. Syst., 2019
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
Security-Aware FSM Design Flow for Identifying and Mitigating Vulnerabilities to Fault Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
Dynamically Obfuscated Scan Chain To Resist Oracle-Guided Attacks On Logic Locked Design.
IACR Cryptol. ePrint Arch., 2019
IACR Cryptol. ePrint Arch., 2019
IEEE Des. Test, 2019
EOP: An Encryption-Obfuscation Solution for Protecting PCBs Against Tampering and Reverse Engineering.
CoRR, 2019
Unlock Your Heart: Next Generation Biometric in Resource-Constrained Healthcare Systems and IoT.
IEEE Access, 2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, 2019
IEEE International Symposium on Hardware Oriented Security and Trust (HOST): Past, Present, and Future.
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the International Conference on Computer-Aided Design, 2019
QIF-Verilog: Quantitative Information-Flow based Hardware Description Languages for Pre-Silicon Security Assessment.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2019
FLATS: Filling Logic and Testing Spatially for FPGA Authentication and Tamper Detection.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2019
Proceedings of the 2019 on Great Lakes Symposium on VLSI, 2019
RAM-Jam: Remote Temperature and Voltage Fault Attack on FPGAs using Memory Collisions.
Proceedings of the 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2019
A Metal-Via Resistance Based Physically Unclonable Function with 1.18% Native Instability.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2019
2018
An On-Chip Dynamically Obfuscated Wrapper for Protecting Supply Chain Against IP and IC Piracies.
IEEE Trans. Very Large Scale Integr. Syst., 2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
ACM Trans. Design Autom. Electr. Syst., 2018
ACM Trans. Design Autom. Electr. Syst., 2018
UCR: An Unclonable Environmentally Sensitive Chipless RFID Tag For Protecting Supply Chain.
ACM Trans. Design Autom. Electr. Syst., 2018
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proc. IEEE, 2018
Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing.
J. Hardw. Syst. Secur., 2018
J. Hardw. Syst. Secur., 2018
Challenges and Opportunities in Analog and Mixed Signal (AMS) Integrated Circuit (IC) Security.
J. Hardw. Syst. Secur., 2018
CoRR, 2018
Secure and Reliable Biometric Access Control for Resource-Constrained Systems and IoT.
CoRR, 2018
Proceedings of the 3rd IEEE International Verification and Security Workshop, 2018
EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs.
Proceedings of the IEEE International Test Conference, 2018
Proceedings of the 2018 IEEE Computer Society Annual Symposium on VLSI, 2018
Proceedings of the 2018 IEEE International Symposium on Hardware Oriented Security and Trust, 2018
Proceedings of the 2018 IEEE International Symposium on Hardware Oriented Security and Trust, 2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
Proceedings of the 55th Annual Design Automation Conference, 2018
Proceedings of the 27th IEEE Asian Test Symposium, 2018
A Comprehensive Analysis on Vulnerability of Active Shields to Tilted Microprobing Attacks.
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2018
2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
CDTA: A Comprehensive Solution for Counterfeit Detection, Traceability, and Authentication in the IoT Supply Chain.
ACM Trans. Design Autom. Electr. Syst., 2017
Obfuscation-Based Protection Framework against Printed Circuit Boards Unauthorized Operation and Reverse Engineering.
ACM Trans. Design Autom. Electr. Syst., 2017
IEEE Trans. Multi Scale Comput. Syst., 2017
SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware.
IEEE Trans. Dependable Secur. Comput., 2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
IEEE Trans. Biomed. Eng., 2017
J. Hardw. Syst. Secur., 2017
Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation.
J. Hardw. Syst. Secur., 2017
Editorial for the Introductory Issue of the <i>Journal of Hardware and Systems Security</i> (HaSS).
J. Hardw. Syst. Secur., 2017
J. Hardw. Syst. Secur., 2017
Novel Bypass Attack and BDD-based Tradeoff Analysis Against all Known Logic Locking Attacks.
IACR Cryptol. ePrint Arch., 2017
IEEE Des. Test, 2017
Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the International Conference on ReConFigurable Computing and FPGAs, 2017
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
Proceedings of the 18th International Workshop on Microprocessor and SOC Test and Verification, 2017
Proceedings of the 18th International Workshop on Microprocessor and SOC Test and Verification, 2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Proceedings of the 2017 IEEE International Conference on Acoustics, 2017
A stochastic all-digital weak physically unclonable function for analog/mixed-signal applications.
Proceedings of the 2017 IEEE International Symposium on Hardware Oriented Security and Trust, 2017
Securing Split Manufactured ICs with Wire Lifting Obfuscated Built-In Self-Authentication.
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017
Proceedings of the 54th Annual Design Automation Conference, 2017
Standardizing Bad Cryptographic Practice: A Teardown of the IEEE Standard for Protecting Electronic-design Intellectual Property.
Proceedings of the 2017 ACM SIGSAC Conference on Computer and Communications Security, 2017
Proceedings of the 2017 ACM SIGSAC Conference on Computer and Communications Security, 2017
Proceedings of the 2017 IEEE EMBS International Conference on Biomedical & Health Informatics, 2017
Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017
Security vulnerability analysis of design-for-test exploits for asset protection in SoCs.
Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017
A split manufacturing approach for unclonable chipless RFIDs for pharmaceutical supply chain security.
Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, 2017
Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, 2017
Proceedings of the 2017 Asian Hardware Oriented Security and Trust Symposium, 2017
2016
A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2016
Design of a Network of Digital Sensor Macros for Extracting Power Supply Noise Profile in SoCs.
IEEE Trans. Very Large Scale Integr. Syst., 2016
Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling.
IEEE Trans. Very Large Scale Integr. Syst., 2016
ACM Trans. Design Autom. Electr. Syst., 2016
FORTIS: A Comprehensive Solution for Establishing Forward Trust for Protecting IPs and ICs.
ACM Trans. Design Autom. Electr. Syst., 2016
IEEE Trans. Multi Scale Comput. Syst., 2016
Guest Editorial: Hardware/Software Cross-Layer Technologies for Trustworthy and Secure Computing.
IEEE Trans. Multi Scale Comput. Syst., 2016
IEEE Trans. Inf. Forensics Secur., 2016
IEEE Trans. Emerg. Top. Comput., 2016
ACM J. Emerg. Technol. Comput. Syst., 2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016
Proceedings of the International Conference on ReConFigurable Computing and FPGAs, 2016
Proceedings of the International Conference on ReConFigurable Computing and FPGAs, 2016
Proceedings of the IEEE 59th International Midwest Symposium on Circuits and Systems, 2016
BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning.
Proceedings of the 2016 IEEE International Test Conference, 2016
Proceedings of the 2016 IEEE International Test Conference, 2016
Selective Enhancement of Randomness at the Materials Level: Poly-Si Based Physical Unclonable Functions (PUFs).
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Gate-level netlist reverse engineering for hardware security: Control logic register identification.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
Proceedings of the 2016 IEEE International Symposium on Hardware Oriented Security and Trust, 2016
Proceedings of the 2016 IEEE International Symposium on Hardware Oriented Security and Trust, 2016
Enhancing noise sensitivity of embedded SRAMs for robust true random number generation in SoCs.
Proceedings of the 2016 IEEE Asian Hardware-Oriented Security and Trust, 2016
Proceedings of the 2016 IEEE Asian Hardware-Oriented Security and Trust, 2016
Proceedings of the 2016 IEEE International Symposium on Hardware Oriented Security and Trust, 2016
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016
Proceedings of the 53rd Annual Design Automation Conference, 2016
2015
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
J. Electron. Test., 2015
A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
Proceedings of the Radio Frequency Identification. Security and Privacy Issues, 2015
Proceedings of the 16th International Workshop on Microprocessor and SOC Test and Verification, 2015
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015
Proceedings of the 33rd IEEE International Conference on Computer Design, 2015
A pair selection algorithm for robust RO-PUF against environmental variations and aging.
Proceedings of the 33rd IEEE International Conference on Computer Design, 2015
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015
Efficient and secure split manufacturing via obfuscated built-in self-authentication.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2015
Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
Investigation of obfuscation-based anti-reverse engineering for printed circuit boards.
Proceedings of the 52nd Annual Design Automation Conference, 2015
2014
IEEE Trans. Very Large Scale Integr. Syst., 2014
Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2014
A Novel Built-In Self-Authentication Technique to Prevent Inserting Hardware Trojans.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.
Proc. IEEE, 2014
ACM J. Emerg. Technol. Comput. Syst., 2014
IEICE Trans. Inf. Syst., 2014
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment.
J. Electron. Test., 2014
J. Electron. Test., 2014
Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 2014 27th International Conference on VLSI Design, 2014
T1A: Opportunities and challenges for secure hardware and verifying trust in integrated circuits.
Proceedings of the 27th IEEE International System-on-Chip Conference, 2014
Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014
CSST: Preventing distribution of unlicensed and rejected ICs by untrusted foundry and assembly.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Proceedings of the 51st Annual Design Automation Conference 2014, 2014
Proceedings of the 51st Annual Design Automation Conference 2014, 2014
An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
Circuit Path Grading Considering Layout, Process Variations, and Cross Talk.
Proceedings of the Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., 2014
Faster-than-at-Speed Test for Screening Small-Delay Defects.
Proceedings of the Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., 2014
2013
IEEE Trans. Very Large Scale Integr. Syst., 2013
ACM Trans. Design Autom. Electr. Syst., 2013
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
Detection of trojans using a combined ring oscillator network and off-chip transient power analysis.
ACM J. Emerg. Technol. Comput. Syst., 2013
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.
J. Electron. Test., 2013
IEEE Des. Test, 2013
IEEE Des. Test, 2013
IEEE Des. Test, 2013
A study on the effectiveness of Trojan detection techniques using a red team blue team approach.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Proceedings of the 14th International Workshop on Microprocessor Test and Verification, 2013
Proceedings of the International Symposium on Quality Electronic Design, 2013
Proceedings of the 2013 IEEE 31st International Conference on Computer Design, 2013
Proceedings of the 2013 IEEE 31st International Conference on Computer Design, 2013
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013
Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013
Proceedings of the 22nd Asian Test Symposium, 2013
Proceedings of the 22nd Asian Test Symposium, 2013
Proceedings of the 22nd Asian Test Symposium, 2013
2012
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements.
IEEE Trans. Very Large Scale Integr. Syst., 2012
A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time.
IEEE Trans. Very Large Scale Integr. Syst., 2012
IEEE Trans. Inf. Forensics Secur., 2012
Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits.
J. Low Power Electron., 2012
Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns.
J. Low Power Electron., 2012
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.
J. Electron. Test., 2012
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.
Proceedings of the 2012 IEEE International Test Conference, 2012
Representative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Experimental analysis of a ring oscillator network for hardware Trojan detection in a 90nm ASIC.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
TSUNAMI: a light-weight on-chip structure for measuring timing uncertainty induced by noise during functional and test operations.
Proceedings of the Great Lakes Symposium on VLSI 2012, 2012
A zero-overhead IC identification technique using clock sweeping and path delay analysis.
Proceedings of the Great Lakes Symposium on VLSI 2012, 2012
Proceedings of the Great Lakes Symposium on VLSI 2012, 2012
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012
Identification of recovered ICs using fingerprints from a light-weight on-chip sensor.
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2011
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities.
IEEE Trans. Inf. Forensics Secur., 2011
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
IEEE Des. Test Comput., 2011
Computer, 2011
Power-safe test application using an effective gating approach considering current limits.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the IEEE 29th International Conference on Computer Design, 2011
Proceedings of the HOST 2011, 2011
Proceedings of the 2011 International Green Computing Conference and Workshops, 2011
Proceedings of the 16th European Test Symposium, 2011
Proceedings of the Design, Automation and Test in Europe, 2011
Proceedings of the 48th Design Automation Conference, 2011
Proceedings of the 20th IEEE Asian Test Symposium, 2011
2010
Proceedings of the Towards Hardware-Intrinsic Security - Foundations and Practice, 2010
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions.
IEEE Trans. Very Large Scale Integr. Syst., 2010
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010
A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes.
J. Low Power Electron., 2010
J. Low Power Electron., 2010
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.
IEICE Trans. Inf. Syst., 2010
IEEE Des. Test Comput., 2010
A layout-aware approach for improving localized switching to detect hardware Trojans in integrated circuits.
Proceedings of the 2010 IEEE International Workshop on Information Forensics and Security, 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG.
Proceedings of the 5th International Design and Test Workshop, 2010
Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010
Proceedings of the 15th European Test Symposium, 2010
Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes.
Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010
Proceedings of the Design, Automation and Test in Europe, 2010
High-quality pattern selection for screening small-delay defects considering process variations and crosstalk.
Proceedings of the Design, Automation and Test in Europe, 2010
Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010
2009
A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 2009 IEEE International Test Conference, 2009
New Design Strategy for Improving Hardware Trojan Detection and Reducing Trojan Activation Time.
Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2009
2008
IEEE Trans. Computers, 2008
Layout-Aware Transition-Delay Fault Pattern Generation with Evenly Distributed Switching Activity.
J. Low Power Electron., 2008
ACM J. Emerg. Technol. Comput. Syst., 2008
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects.
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths.
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008
Power supply signal calibration techniques for improving detection resolution to hardware Trojans.
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008
Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2008
Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2008
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis.
Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008
Proceedings of the Design, Automation and Test in Europe, 2008
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.
Proceedings of the 17th IEEE Asian Test Symposium, 2008
2007
ACM Trans. Design Autom. Electr. Syst., 2007
IEEE Trans. Dependable Secur. Comput., 2007
Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing.
ACM J. Emerg. Technol. Comput. Syst., 2007
IEEE Des. Test Comput., 2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design.
Proceedings of the 44th Design Automation Conference, 2007
2006
IEEE Des. Test Comput., 2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the 2006 International Conference on Computer-Aided Design, 2006
Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, 2006
Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, 2006
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006
Proceedings of the 43rd Design Automation Conference, 2006
Proceedings of the 43rd Design Automation Conference, 2006
2005
IEEE Trans. Very Large Scale Integr. Syst., 2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005