Mark A. Anders
Affiliations:- National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
- Penn State University, Department of Engineering Science and Mechanics, University Park, PA, USA (PhD 2017)
According to our database1,
Mark A. Anders
authored at least 4 papers
between 2015 and 2023.
Collaborative distances:
Collaborative distances:
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Online presence:
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on nist.gov
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Bibliography
2023
Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2019
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance.
Microelectron. Reliab., 2018
2015
Negative bias instability in 4H-SiC MOSFETS: Evidence for structural changes in the SiC.
Proceedings of the IEEE International Reliability Physics Symposium, 2015