Maria K. Y. Chan
Orcid: 0000-0003-0922-1363
According to our database1,
Maria K. Y. Chan
authored at least 8 papers
between 2021 and 2023.
Collaborative distances:
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Bibliography
2023
EXSCLAIM!: Harnessing materials science literature for self-labeled microscopy datasets.
Patterns, November, 2023
2022
Universal machine learning framework for defect predictions in zinc blende semiconductors.
Patterns, 2022
Ensemble of Pre-Trained Neural Networks for Segmentation and Quality Detection of Transmission Electron Microscopy Images.
CoRR, 2022
Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns.
CoRR, 2022
2021
EXSCLAIM! - An automated pipeline for the construction of labeled materials imaging datasets from literature.
CoRR, 2021
Proceedings of the 2021 IEEE International Conference on Image Processing, 2021