Marcello Dalpasso
Orcid: 0000-0002-9242-3435
According to our database1,
Marcello Dalpasso
authored at least 33 papers
between 1992 and 2024.
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Bibliography
2024
J. Heuristics, August, 2024
2023
CoRR, 2023
2020
2019
Algorithms, 2019
Proceedings of the Database and Expert Systems Applications, 2019
2018
Proceedings of the Database and Expert Systems Applications, 2018
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2016
IEEE Trans. Computers, 2016
2015
Central Eur. J. Oper. Res., 2015
2014
Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits.
IET Comput. Digit. Tech., 2014
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits.
J. Electron. Test., 2014
2009
2007
High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations.
Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
2005
Proceedings of the Comparative Genomics, 2005
2002
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002
An Evolutionary Approach to the Design of On-Chip Pseudorandom Test Pattern Generators.
Proceedings of the 2002 Design, 2002
2000
Proceedings of the 2000 Design, 2000
Proceedings of the 37th Conference on Design Automation, 2000
1999
Proceedings of the 1999 Design, 1999
1998
1997
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997
1996
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996
1995
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995
Proceedings of the 1995 European Design and Test Conference, 1995
1994
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994
1993
IEEE Trans. Very Large Scale Integr. Syst., 1993
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993
1992
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992