Marcella Carissimi
Orcid: 0000-0003-0928-6095
According to our database1,
Marcella Carissimi
authored at least 15 papers
between 2017 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Combined HW/SW Drift and Variability Mitigation for PCM-Based Analog In-Memory Computing for Neural Network Applications.
IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023
2022
J. Comput. Civ. Eng., 2022
Phase-change memory cells characterization in an analog in-memory computing perspective.
Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022
An embedded PCM Peripheral Unit adding Analog MAC In-Memory Computing Feature addressing Non-linearity and Time Drift Compensation.
Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022
2021
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
2020
Proceedings of the 33rd International Conference on VLSI Design and 19th International Conference on Embedded Systems, 2020
2019
Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
2-Mb Embedded Phase Change Memory With 16-ns Read Access Time and 5-Mb/s Write Throughput in 90-nm BCD Technology for Automotive Applications.
Proceedings of the 45th IEEE European Solid State Circuits Conference, 2019
2018
Microelectron. J., 2018
A 32-KB ePCM for Real-Time Data Processing in Automotive and Smart Power Applications.
IEEE J. Solid State Circuits, 2018
2017
A 32KB 18ns random access time embedded PCM with enhanced program throughput for automotive and smart power applications.
Proceedings of the 43rd IEEE European Solid State Circuits Conference, 2017