Marcel A. J. van Gils

According to our database, Marcel A. J. van Gils authored at least 9 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Temperature stability of a piezoresistive MEMS resonator including self-heating.

S. Bendida, J. J. Koning, J. J. M. Bontemps, J. T. M. van Beek, D. Wu, Marcel A. J. van Gils, S. Nath

Microelectron. Reliab., 2008

2007

Efficient damage sensitivity analysis of advanced Cu/low-k bond pad structures by means of the area release energy criterion.

Olaf van der Sluis, R. A. B. Engelen, Richard B. R. van Silfhout, W. D. van Driel, Marcel A. J. van Gils

Microelectron. Reliab., 2007

Analysis of Cu/low-k bond pad delamination by using a novel failure index.

Marcel A. J. van Gils, Olaf van der Sluis, G. Q. Zhang, J. H. J. Janssen, R. M. J. Voncken

Microelectron. Reliab., 2007

Virtual qualification of moisture induced failures of advanced packages.

Marcel A. J. van Gils, W. D. van Driel, G. Q. Zhang, H. J. L. Bressers, Richard B. R. van Silfhout, X. J. Fan, J. H. J. Janssen

Microelectron. Reliab., 2007

Advanced structural similarity rules for the BGA package family.

W. D. van Driel, A. Mavinkurve, Marcel A. J. van Gils, G. Q. Zhang

Microelectron. Reliab., 2007

2005

Prediction of Delamination Related IC & Packaging Reliability Problems.

W. D. van Driel, Marcel A. J. van Gils, Richard B. R. van Silfhout, G. Q. Zhang

Microelectron. Reliab., 2005

2004

Prediction of crack growth in IC passivation layers.

Y. T. He, Marcel A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst

Microelectron. Reliab., 2004

Characterization and Modelling of Moisture Driven Interface Failures.

Marcel A. J. van Gils, P. J. J. H. A. Habets, G. Q. Zhang, Willem D. van Driel, Piet J. G. Schreurs

Microelectron. Reliab., 2004

Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods.

Willem D. van Driel, C. J. Liu, G. Q. Zhang, J. H. J. Janssen, Richard B. R. van Silfhout, Marcel A. J. van Gils, Leo J. Ernst

Microelectron. Reliab., 2004