Marampally Saikiran

According to our database, Marampally Saikiran authored at least 11 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient.

Vijayalakshmi Naganadhan, Marampally Saikiran, Mahmoud Gshash, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis.

Mona Ganji, Marampally Saikiran, Degang Chen

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models.

Mona Ganji, Marampally Saikiran, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2020

Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.

Marampally Saikiran, Mona Ganji, Degang Chen

Proceedings of the IEEE International Test Conference, 2020