Manuel Iván Rodríguez-Borbón

According to our database, Manuel Iván Rodríguez-Borbón authored at least 10 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Lean Manufacturing Critical Success Factors for the Transportation Equipment Manufacturing Industry in Mexico.

Marina De La Vega, Yolanda A. Báez-López, Jorge Limon-Romero, Diego A. Tlapa, Dora-Luz Flores, Manuel Iván Rodríguez-Borbón, Aidé Aracely Maldonado-Macías

IEEE Access, 2020

2019

A Deconvolution Approach for Degradation Modeling With Measurement Error.

Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón

IEEE Access, 2019

2018

Degradation modeling based on gamma process models with random effects.

Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta

Commun. Stat. Simul. Comput., 2018

2017

Optimization of Multiple Response Variables Using the Desirability Function and a Bayesian Predictive Distribution.

Jorge Limon-Romero, Yolanda A. Báez, Diego A. Tlapa, Mitzy Pory-Lugo, Manuel Iván Rodríguez-Borbón

Res. Comput. Sci., 2017

Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect.

Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha

Qual. Reliab. Eng. Int., 2017

2016

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution.

Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle

Qual. Reliab. Eng. Int., 2016

Non-normal Capability Indices for the Weibull and Lognormal Distributions.

Manuel R. Piña-Monarrez, Jesús F. Ortiz-Yañez, Manuel Iván Rodríguez-Borbón

Qual. Reliab. Eng. Int., 2016

Reliability Model for Electronic Devices under Time Varying Voltage.

Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez

Qual. Reliab. Eng. Int., 2016

Reliability Analysis for Laptop Computer Under Electrical Harmonics.

Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle

Qual. Reliab. Eng. Int., 2016

2013

Optimization of the material flow in a manufacturing plant by use of artificial bee colony algorithm.

Alejandro Alvarado-Iniesta, Jorge Luis García-Alcaraz, Manuel Iván Rodríguez-Borbón, Aidé Maldonado

Expert Syst. Appl., 2013