Manolis Kaliorakis
Orcid: 0000-0002-8067-240X
According to our database1,
Manolis Kaliorakis
authored at least 25 papers
between 2013 and 2024.
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Bibliography
2024
Proceedings of the Proceedings 27th International Conference on Extending Database Technology, 2024
Proceedings of the Proceedings 27th International Conference on Extending Database Technology, 2024
2023
Proceedings of the IEEE/ACM 10th International Conference on Big Data Computing, 2023
2021
A System-Level Voltage/Frequency Scaling Characterization Framework for Multicore CPUs.
CoRR, 2021
2019
SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems.
IEEE Trans. Computers, 2019
2018
Methodologies for accelerated analysis of the reliability and the energy efficiency levels of modern microprocessor architectures
PhD thesis, 2018
IEEE Comput. Archit. Lett., 2018
Micro-Viruses for Fast System-Level Voltage Margins Characterization in Multicore CPUs.
Proceedings of the IEEE International Symposium on Performance Analysis of Systems and Software, 2018
Proceedings of the 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, 2018
An energy-efficient and error-resilient server ecosystem exceeding conservative scaling limits.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2017
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture, 2017
MeRLiN: Exploiting Dynamic Instruction Behavior for Fast and Accurate Microarchitecture Level Reliability Assessment.
Proceedings of the 44th Annual International Symposium on Computer Architecture, 2017
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017
RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU.
Proceedings of the 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, 2017
2016
Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Proceedings of the 2016 IEEE International Test Conference, 2016
2015
Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview.
Microprocess. Microsystems, 2015
Bayesian network early reliability evaluation analysis for both permanent and transient faults.
Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015
Proceedings of the 2015 IEEE International Symposium on Workload Characterization, 2015
Proceedings of the 20th IEEE European Test Symposium, 2015
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Versatile architecture-level fault injection framework for reliability evaluation: A first report.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
2013
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013