Manan Syal
According to our database1,
Manan Syal
authored at least 11 papers
between 2003 and 2006.
Collaborative distances:
Collaborative distances:
Timeline
2003
2004
2005
2006
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults.
Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005
Proceedings of the Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30, 2005
Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
2004
Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004
Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
2003
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003
Proceedings of the 2003 Design, 2003