Malvika
Orcid: 0000-0001-6832-2450Timeline
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Bibliography
2022
Analysis of performance for novel pocket-doped NCFET under the influence of interface trap charges and temperature variation.
Microelectron. J., 2022
Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2022
A simulation study of the effect of ferroelectric thickness and oxide variation on the performance of Highly Doped Double Pocket Double Gate NCFET based inverter.
Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2022