Maikel van Beurden

According to our database, Maikel van Beurden authored at least 3 papers between 2011 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Defect Oriented Testing for Analog/Mixed-Signal Designs.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

IEEE Des. Test Comput., 2012

2011

Defect Oriented Testing for analog/mixed-signal devices.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

Proceedings of the 2011 IEEE International Test Conference, 2011

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.

Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing

Proceedings of the Design, Automation and Test in Europe, 2011