Mahroo Zandrahimi

According to our database, Mahroo Zandrahimi authored at least 10 papers between 2010 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

J. Electron. Test., 2019

2018

Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

An industrial case study of low cost adaptive voltage scaling using delay test patterns.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Using transition fault test patterns for cost effective offline performance estimation.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2016

Industrial approaches for performance evaluation using on-chip monitors.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 11th International Design & Test Symposium, 2016

Challenges of using on-chip performance monitors for process and environmental variation compensation.

Mahroo Zandrahimi, Zaid Al-Ars, Philippe Debaud, Armand Castillejo

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2014

A Survey on Low-Power Techniques for Single and Multicore Systems.

Mahroo Zandrahimi, Zaid Al-Ars

Proceedings of the 3rd International Conference on Context-Aware Systems and Applications, 2014

2012

Two effective methods to detect anomalies in embedded systems.

Mahroo Zandrahimi, Hamid R. Zarandi, Mohammad Hadi Mottaghi

Microelectron. J., 2012

2010

A Probabilistic Method to Detect Anomalies in Embedded Systems.

Mahroo Zandrahimi, Alireza Zarei, Hamid R. Zarandi

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010