Magali Bastian
According to our database1,
Magali Bastian
authored at least 22 papers
between 2003 and 2009.
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Timeline
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Bibliography
2009
IEEE Trans. Very Large Scale Integr. Syst., 2009
Proceedings of the Design, Automation and Test in Europe, 2009
2008
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008
Proceedings of the Design, Automation and Test in Europe, 2008
2007
J. Electron. Test., 2007
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.
Proceedings of the 12th European Test Symposium, 2007
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
Proceedings of the 16th Asian Test Symposium, 2007
2006
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
J. Electron. Test., 2006
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.
Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006
2005
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
J. Electron. Test., 2005
J. Electron. Test., 2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization.
Proceedings of the 10th European Test Symposium, 2005
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.
Proceedings of the 42nd Design Automation Conference, 2005
2004
Proceedings of the 9th European Test Symposium, 2004
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004
2003
Proceedings of the 8th European Test Workshop, 2003