M. Zahir

According to our database, M. Zahir authored at least 1 paper in 2015.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2015

A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation.

A. Bensoussan, Ephraim Suhir, P. Henderson, M. Zahir

Microelectron. Reliab., 2015