M. Y. Li

According to our database, M. Y. Li authored at least 6 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A World First QLC RRAM: Highly Reliable Resistive-Gate Flash with Record 10⁸ Endurance and Excellent Retention.

M. Y. Li, J. P. Lee, C. H. Liu, J. C. Guo, Steve S. Chung

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2015

Study of sub-5 nm RRAM, tunneling selector and selector less device.

Kai-Shin Li, Ming-Taou Lee, Min-Cheng Chen, Cho-Lun Hsu, J. M. Lu, C. H. Lin, C. C. Chen, B. W. Wu, Y. F. Hou, C. Yi. Lin, Y. J. Chen, T. Y. Lai, M. Y. Li, I. Yang, C. S. Wu, Fu-Liang Yang, W. K. Yeh

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2012

An Optimization Method for Training Generalized Hidden Markov Model based on Generalized Jensen Inequality.

Youmin Hu, Fengyun Xie, Bo Wu, Yan Cheng, Guangfei Jia, Yan Wang, M. Y. Li

Proceedings of the ICINCO 2012 - Proceedings of the 9th International Conference on Informatics in Control, Automation and Robotics, Volume 1, Rome, Italy, 28, 2012

2011

Capability assessment for processes with multiple characteristics: A generalization of the popular index <i>C</i>_<i>pk</i>.

Wen Lea Pearn, J.-J. H. Shiau, Yu-Ting Tai, M. Y. Li

Qual. Reliab. Eng. Int., 2011

2006

Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling.

Hongtao Chen, C. Q. Wang, M. Y. Li

Microelectron. Reliab., 2006

A total entropy model of spatial data uncertainty.

Y. F. Shi, F. X. Jin, M. Y. Li

J. Inf. Sci., 2006