M. Traving

According to our database, M. Traving authored at least 1 paper in 2016.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2016

Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.

Andreas Martin, Rolf-Peter Vollertsen, A. Mitchell, M. Traving, D. Beckmeier, H. Nielen

Microelectron. Reliab., 2016