M. Simões

According to our database1, M. Simões authored at least 3 papers between 1993 and 1995.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

1995
Test preparation for high coverage of physical defects in CMOS digital ICs.
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Test preparation methodology for high coverage of physical defects in CMOS digital ICs.
Proceedings of the 1995 European Design and Test Conference, 1995

1993
Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs.
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993


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