M. Santosh
Orcid: 0000-0002-3384-3501
According to our database1,
M. Santosh
authored at least 15 papers
between 2017 and 2024.
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Bibliography
2024
Modeling, hardware architecture, and performance analyses of an AEAD-based lightweight cipher.
J. Real Time Image Process., April, 2024
Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024
2023
Flash-flood susceptibility mapping: a novel credal decision tree-based ensemble approaches.
Earth Sci. Informatics, December, 2023
Logic locking for IP security: A comprehensive analysis on challenges, techniques, and trends.
Comput. Secur., June, 2023
Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2023
Proceedings of the Next Generation Arithmetic - 4th International Conference, 2023
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2023
2022
Artificial neural networks in drought prediction in the 21st century-A scientometric analysis.
Appl. Soft Comput., 2022
2021
Landslide Susceptibility Modeling: An Integrated Novel Method Based on Machine Learning Feature Transformation.
Remote. Sens., 2021
Early Results from Automating Voice-based Question-Answering Services Among Low-income Populations in India.
Proceedings of the COMPASS '21: ACM SIGCAS Conference on Computing and Sustainable Societies, Virtual Event, Australia, 28 June 2021, 2021
2019
Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019
IoT Platform to augment Solar Tree as Smart Highway Street Light with Ambient Monitoring Capability.
Proceedings of the 10th International Conference on Computing, 2019
2018
Silicon Nanowire Based Platform Device for Chemical/Bio-Chemical Sensing Applications.
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018
2017
Characterization and Compensation Circuitry for Piezo-Resistive Pressure Sensor to Accommodate Temperature Induced Variation.
Proceedings of the VLSI Design and Test - 21st International Symposium, 2017