M. Röhner

According to our database1, M. Röhner authored at least 2 papers between 2006 and 2014.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

2006
2007
2008
2009
2010
2011
2012
2013
2014
0
1
2
1
1

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2014
HCS degradation of 5 nm oxide high-voltage PLDMOS.
Microelectron. Reliab., 2014

2006
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides.
Microelectron. Reliab., 2006


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