M. R. Shaneyfelt

According to our database, M. R. Shaneyfelt authored at least 1 paper in 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics.

J. A. Felix, J. R. Schwank, Daniel M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev

Microelectron. Reliab., 2004