M. Langenbuch

According to our database, M. Langenbuch authored at least 2 papers in 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability.

M. Langenbuch, R. Bottini, Maria Elena Vitali, G. Ghidini

Microelectron. Reliab., 2005

Impact of interface and bulk trapped charges on transistor reliability.

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia

Microelectron. Reliab., 2005