M. Kogelschatz

According to our database, M. Kogelschatz authored at least 1 paper in 2013.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of six.

2013

Impact of bilayer character on High K gate stack dielectrics breakdown obtained by conductive atomic force microscopy.

R. Foissac, S. Blonkowski, M. Kogelschatz, P. Delcroix, M. Gros-Jean, F. Bassani

Microelectron. Reliab., 2013