M. K. Radhakrishnan

According to our database, M. K. Radhakrishnan authored at least 4 papers between 2002 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects.

M. K. Radhakrishnan

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM.

Kin Leong Pey, C. H. Tung, M. K. Radhakrishnan, L. J. Tang, Y. Sun, X. D. Wang, W. H. Lin

Microelectron. Reliab., 2003

ESD Reliability Challenges for RF/Mixed Signal Design & Processing.

Natarajan Mahadeva Iyer, M. K. Radhakrishnan

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

2002

Physical analysis of hard and soft breakdown failures in ultrathin gate oxides.

M. K. Radhakrishnan, Kin Leong Pey, C. H. Tung, W. H. Lin

Microelectron. Reliab., 2002