M. Hong
According to our database1,
M. Hong
authored at least 4 papers
between 2019 and 2024.
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Bibliography
2024
Highly Robust All-Oxide Transistors with Ultrathin In2O3 as Channel and Thick In2O3 as Metal Gate Towards Vertical Logic and Memory.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Exploring Innovative IGZO-channel based DRAM Cell Architectures and Key Technologies for Sub-10nm Node.
Proceedings of the IEEE International Memory Workshop, 2024
2019
Fundamental Understanding of Oxide Defects in HfO2 and Y2O3 on GaAs(001) with High Thermal Stability.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing.
Proceedings of the IEEE International Reliability Physics Symposium, 2019