M. Gares

According to our database1, M. Gares authored at least 10 papers between 2006 and 2014.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2014
Performance drifts of N-MOSFETs under pulsed RF life test.
Microelectron. Reliab., 2014

Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests.
Microelectron. J., 2014

2012
Failure analysis of hot-electron effect on power RF N-LDMOS transistors.
Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2011
S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects.
Microelectron. Reliab., 2011

2007
Study of hot-carrier effects on power RF LDMOS device reliability.
Microelectron. Reliab., 2007

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.
Microelectron. Reliab., 2007

Reliability study of power RF LDMOS device under thermal stress.
Microelectron. J., 2007

2006
Hot carrier reliability of RF N- LDMOS for S Band radar application.
Microelectron. Reliab., 2006

Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests.
Microelectron. Reliab., 2006

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.
Proceedings of the Canadian Conference on Electrical and Computer Engineering, 2006


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