M. Gall
According to our database1,
M. Gall
authored at least 3 papers
between 1997 and 2024.
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Bibliography
2024
A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2004
J. Comput. Assist. Learn., 2004
1997
Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs].
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997