M. Bidaud

According to our database, M. Bidaud authored at least 1 paper in 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2003

Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices.

M. Fadlallah, C. Petit, A. Meinertzhagen, Gérard Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader

Microelectron. Reliab., 2003