M. Avramenko

According to our database, M. Avramenko authored at least 3 papers in 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs.

Peter Moens, F. Geenen, M. Avramenko, G. Gomez-Garcia, Kevin Matocha

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements.

Alberto Marcuzzi, M. Avramenko, Carlo De Santi, Peter Moens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress.

M. Avramenko, L. De Schepper, J.-F. Cano, F. Geenen, Peter Moens, Alberto Marcuzzi, Carlo De Santi, Matteo Meneghini

Proceedings of the IEEE International Reliability Physics Symposium, 2024