M. A. Exarchos

According to our database, M. A. Exarchos authored at least 9 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs.

M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra

Microelectron. Reliab., 2009

2008

Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.

Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas

Microelectron. Reliab., 2008

2007

Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.

Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2007

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.

Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

Microelectron. Reliab., 2007

2006

Charging of radiation induced defects in RF MEMS dielectric films.

M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana

Microelectron. Reliab., 2006

2005

Investigation of charging mechanisms in metal-insulator-metal structures.

M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2005

The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs.

M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra

Microelectron. Reliab., 2005

2004

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.

Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis

Microelectron. Reliab., 2004

On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs.

M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra

Microelectron. Reliab., 2004