Lyl M. Ciganda Brasca

According to our database, Lyl M. Ciganda Brasca authored at least 16 papers between 2009 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2015

SW-based transparent in-field memory testing.

Paolo Bernardi, Lyl M. Ciganda Brasca, Matteo Sonza Reorda, Said Hamdioui

Proceedings of the 16th Latin-American Test Symposium, 2015

2014

MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test.

Paolo Bernardi, Lyl Mercedes Ciganda, Ernesto Sánchez, Matteo Sonza Reorda

IEEE Trans. Computers, 2014

On the in-field functional testing of decode units in pipelined RISC processors.

Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Ernesto Sánchez, Matteo Sonza Reorda, Sergio de Luca, Renato Meregalli, Alessandro Sansonetti

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

An effective approach to automatic functional processor test generation for small-delay faults.

Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

New techniques for reliability characterization of electronic circuits.

Lyl M. Ciganda Brasca

PhD thesis, 2013

On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors.

Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Boyang Du, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan

Proceedings of the 14th International Workshop on Microprocessor Test and Verification, 2013

A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors.

Paolo Bernardi, D. Boyang, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan

Proceedings of the 8th International Design and Test Symposium, 2013

An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase.

Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui

Proceedings of the 22nd Asian Test Symposium, 2013

2012

An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis.

Paolo Bernardi, Lyl M. Ciganda

IEEE Trans. Instrum. Meas., 2012

Automatic Generation of On-Line Test Programs through a Cooperation Scheme.

Lyl M. Ciganda, Marco Gaudesi, Evelyne Lutton, Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda

Proceedings of the 13th International Workshop on Microprocessor Test and Verification, 2012

On-line software-based self-test of the Address Calculation Unit in RISC processors.

Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan

Proceedings of the 17th IEEE European Test Symposium, 2012

A SBST strategy to test microprocessors' Branch Target Buffer.

Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test.

Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Luciano Bonaria, Roberto Losco, Luciano Marcigot, Maurizio Straiotto

J. Electron. Test., 2011

An effective methodology for on-line testing of embedded microprocessors.

Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

2010

A tester architecture suitable for MEMS calibration and testing.

Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs.

Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009