Lulu Zhang
Orcid: 0000-0002-7753-7426Affiliations:
- National Metrology Institute of Japan, National, NMIJ, Nanomaterial Structure Analysis Research Group, Tsukuba, Ibaraki, Japan
- National Institute of Advanced Industrial Science and Technology, AIST, Japan (1998-2004)
- Osaka University, Suita, Japan (PhD 1998)
According to our database1,
Lulu Zhang
authored at least 8 papers
between 2015 and 2022.
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Bibliography
2022
Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry.
IEEE Trans. Instrum. Meas., 2022
2021
IEEE Trans. Instrum. Meas., 2021
Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ.
IEEE Trans. Instrum. Meas., 2021
2019
Volume Measurement of a <sup>28</sup>Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2019
2017
Thickness Measurement of Oxide and Carbonaceous Layers on a <sup>28</sup>Si Sphere by XPS.
IEEE Trans. Instrum. Meas., 2017
Mass Measurement of <sup>28</sup>Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant.
IEEE Trans. Instrum. Meas., 2017
IEEE Trans. Instrum. Meas., 2017
2015