Lulu Zhang

Orcid: 0000-0002-7753-7426

Affiliations:
  • National Metrology Institute of Japan, National, NMIJ, Nanomaterial Structure Analysis Research Group, Tsukuba, Ibaraki, Japan
  • National Institute of Advanced Industrial Science and Technology, AIST, Japan (1998-2004)
  • Osaka University, Suita, Japan (PhD 1998)


According to our database1, Lulu Zhang authored at least 8 papers between 2015 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

2015
2016
2017
2018
2019
2020
2021
2022
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Legend:

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Article 
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Links

Online presence:

On csauthors.net:

Bibliography

2022
Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry.
IEEE Trans. Instrum. Meas., 2022

2021
XPS Analysis of a <sup>28</sup>Si-Enriched Sphere for Realization of the Kilogram.
IEEE Trans. Instrum. Meas., 2021

Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ.
IEEE Trans. Instrum. Meas., 2021

2019
Volume Measurement of a <sup>28</sup>Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2019

2017
Thickness Measurement of Oxide and Carbonaceous Layers on a <sup>28</sup>Si Sphere by XPS.
IEEE Trans. Instrum. Meas., 2017

Mass Measurement of <sup>28</sup>Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant.
IEEE Trans. Instrum. Meas., 2017

Realization of the Kilogram Based on the Planck Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2017

2015
Surface Layer Analysis of Si Sphere by XRF and XPS.
IEEE Trans. Instrum. Meas., 2015


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