Lukasz Rybak

Orcid: 0000-0001-6219-358X

Affiliations:

Siemens Digital Industries Software, Wilsonville, OR, USA

According to our database¹, Lukasz Rybak authored at least 4 papers between 2015 and 2022.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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Bibliography

2022

LBIST for Automotive ICs With Enhanced Test Generation.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020

Test Sequence-Optimized BIST for Automotive Applications.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2020

2017

Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2015

A deterministic BIST scheme based on EDT-compressed test patterns.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

Lukasz Rybak

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Bibliography

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