Lukas M. Eng
Orcid: 0000-0002-2484-4158
According to our database1,
Lukas M. Eng
authored at least 6 papers
between 2017 and 2024.
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Collaborative distances:
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
Improved Endurance Reliability of Ferroelectric Hafnium Oxide-Based BEoL Integrated MFM Capacitors.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2022
Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination.
Proceedings of the IEEE International Memory Workshop, 2022
2020
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Designing a Robust Kelvin Probe Setup Optimized for Long-Term Surface Photovoltage Acquisition.
Sensors, 2018
2017
Anti-ferroelectric ZrO2, an enabler for low power non-volatile 1T-1C and 1T random access memories.
Proceedings of the 47th European Solid-State Device Research Conference, 2017