Luc De Schepper

According to our database, Luc De Schepper authored at least 8 papers between 2001 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.

Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin

Microelectron. Reliab., 2008

2003

A new method for the analysis of high-resolution SILC data.

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2003

2002

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.

R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons

Microelectron. Reliab., 2002

High-resolution SILC measurements of thin SiO₂ at ultra low voltages.

Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger

Microelectron. Reliab., 2002

Statistical aspects of the degradation of LDD nMOSFETs.

E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2002

2001

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation.

R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons

Microelectron. Reliab., 2001

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation.

R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken

Microelectron. Reliab., 2001

High-resolution in-situ of gold electromigration: test time reduction.

Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel

Microelectron. Reliab., 2001