Louis Y.-Z. Lin

According to our database, Louis Y.-Z. Lin authored at least 9 papers between 2013 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

P4-TPG: Accelerating Deterministic Parallel Test Pattern Generation by Preemptive, Proactive, and Preventive Schedulings.

Louis Y.-Z. Lin, Charles Chia-Hao Hsu, Charles H.-P. Wen

IEEE Access, 2019

2018

Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test Pattern Generation.

Louis Y.-Z. Lin, Charles H.-P. Wen

IEEE Access, 2018

2017

Coupling-Aware Functional Timing Analysis for Tighter Bounds: How Much Margin Can We Relax?

Jack S.-Y. Lin, Louis Y.-Z. Lin, Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2016

Speed binning with high-quality structural patterns from functional timing analysis (FTA).

Louis Y.-Z. Lin, Charles H.-P. Wen

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015

TA-FTA: transition-aware functional timing analysis with a four-valued encoding.

Jasper C. C. Chang, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen

Proceedings of the 52nd Annual Design Automation Conference, 2015

2014

CASTA: CUDA-Accelerated Static Timing Analysis for VLSI Designs.

Hunta H.-W. Wang, Louis Y.-Z. Lin, Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the 43rd International Conference on Parallel Processing, 2014

Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation.

Jerry C. Y. Ku, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2013

Fast Scan-Chain Ordering for 3-D-IC Designs Under Through-Silicon-Via (TSV) Constraints.

Christina C.-H. Liao, Allen W.-T. Chen, Louis Y.-Z. Lin, Charles H.-P. Wen

IEEE Trans. Very Large Scale Integr. Syst., 2013

Synthesizing multiple scan chains by cost-driven spectral ordering.

Louis Y.-Z. Lin, Christina C.-H. Liao, Charles H.-P. Wen

Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013